【Host】 Dr. Kaibo Wang 

【Date】Thursday June 11, 2015  1:30-2:30pm 

【Venue】Room 510, Shunde Building 

【Abstract】Reliability field data such as that obtained from warranty claims and maintenance records have been used traditionally for such purposes as generating predictions for warranty costs and optimizing the cost of system operation and maintenance. In the current (and future) generation of many products, the nature of field reliability data is changing dramatically. In particular, products can be outfitted with sensors that can be used to capture information about how and when and under what environmental and operating conditions products are being used. Today some of that information is being used to monitor system health and interest is building to develop prognostic information systems. There are, however, many other potential applications for using such data. In this talk, I will review some applications where field reliability data are used and explore some of the opportunities to use modern reliability data to provide stronger statistical methods to operate and predict the performance of systems in the field. I will also provide some examples of recent technical developments designed to be used in such applications and outline remaining challenges. 

This is a joint work with William Q. Meeker.

【Bio】 Dr. Yili Hong received a BS in statistics in 2004 from University of Science and Technology of China. He received his MS in statistics in 2005 and PhD in statistics in 2009 from Iowa State University. He is currently an Associate Professor in the Department of Statistics at Virginia Tech.  His research mainly focuses on statistical reliability. Areas include lifetime data analysis, field failure prediction, accelerated life test planning and analysis, accelerated degradation test planning and data analysis, system health monitoring, and applications in engineering, chemistry and material sciences. His research has been published in top journals such as Technometrics, Annals of Applied Statistics, JASA, IEEE Transactions on Reliability, and Quality Engineering.

Dr. Hong has strong interests in doing collaborative research. He worked with researchers at GE on reliability of complex systems. He worked with polymer scientists at NIST on service life prediction of epoxy coatings and has been working on service life prediction of polymeric components in PV systems. He has been working on polymer composite fatigue test data and polymeric material accelerated destructive degradation test data analysis with researchers from DuPont. 

Dr. Hong is one of the recipients of the 2011 DuPont Young Professor Award. He is an associate editor for Technometrics. He is an elected member of International Statistical Institute.